X-Ray Diffractometer (XRD)
DESCRIPTION
X’Pert MRD diffractomer from PANalytical with Euler cradle. Ideal for measurement of residual stresses and crystallographic texture. Horizontal diffactometer with both Bragg-Brentano and parallel beam optics. Max. weight 500 g, max. height 24 mm. Two radiations available, Cu and Cr. Possibility of thin films characterization by Grazing Incidence X-Ray Diffraction. Software HIGH SCORE for phase identification; STRESS and TEXTURE for residual stresses and texture analysis, respectively. Indispensable technique for analysis and characterization of a wide range of materials.
MOST OUTSTANDING EQUIPMENT AND COMPONENTS
Co and Cr X-ray tubesParallel beam optics (pollicapilar lens, parallel plate collimator, graphite flat monochromator). Small angle slits for Grazing Incidence X-Ray Diffraction.
X’Pert MRD diffractometer with Euler cradle, Cu radiation, Bragg-brentano optics, cross-slit collimator, programable receiving slit, Xe proportional detector, softwares Data Collector”, PC-STRESS and PC-TEXTURE
SERVICES OFFERED BY THE ASSET
Crystallographic texture
Measurement of residual stresses
Phase identification and quantification by conventional and grazing incidence in different materials and thin films. Quantification of crystallite size and micro-stresses.
Quantification of fraction of retained austenite in steels
ENTITY MANAGING THE ASSET
CEIT
Contact person: Carmen García-Rosales
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